International Journal of Computing, Programming and Database Management

P-ISSN: 2707-6636, E-ISSN: 2707-6644
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2023, Vol. 4, Issue 1, Part A

On approach to optimize manufacturing of field-effect transistors framework a conventional full-bridge converter to increase their integration rate: On influence mismatch-induced stress


Author(s): EL Pankratov

Abstract:
In this paper we introduce an approach to increase density of field-effect transistors framework a conventional full-bridge converter. In the framework of the approach we consider manufacturing the inverter in heterostructure with specific configuration. Several required areas of the heterostructure should be doped by diffusion or ion implantation. After that dopant and radiation defects should by annealed framework optimized scheme. We also consider an approach to decrease value of mismatch-induced stress in the considered heterostructure. We introduce an analytical approach to analyze mass and heat transport in heterostructures during manufacturing of integrated circuits with account mismatch-induced stress.


DOI: 10.33545/27076636.2023.v4.i1a.80

Pages: 43-61 | Views: 241 | Downloads: 72

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How to cite this article:
EL Pankratov. On approach to optimize manufacturing of field-effect transistors framework a conventional full-bridge converter to increase their integration rate: On influence mismatch-induced stress. Int J Comput Programming Database Manage 2023;4(1):43-61. DOI: 10.33545/27076636.2023.v4.i1a.80
International Journal of Computing, Programming and Database Management

International Journal of Computing, Programming and Database Management

International Journal of Computing, Programming and Database Management
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